Technologies available for licensing, investment, joint ventures and R&D contracts in Ukraine, Azerbaijan, Georgia, Moldova, Uzbekistan

Frontpage Slideshow (version 2.0.0) - Copyright © 2006-2008 by JoomlaWorks

Google Translate

Patenting Information

Tag Cloud



Free counters!

Home Georgian Technologies Standard Samples for X-Ray Fluorescence Measurements

Standard Samples for X-Ray Fluorescence Measurements

Description

X-ray fluorescence Analysis (XRF) method is one of the most popular among the modern nuclear physical methods of analysis of the elemental composition of materials because it allows a large number of elements to be identified without destruction of the investigated sample.

XRF is a comparative method, and as all other similar methods, it needs samples for comparison, which are called Reference Materials (RM).

For complete metrological reliability of the XRF method it is necessary to have RMs for calibration, certification and examination of XRF measuring equipment at the production stage and in the process of operation, and to have RMs of different elemental composition and concentrations for performing analysis.

In Andronikashvili Institute of Physics is developed unique technology of manufacturing of standard samples for calibration of XRF measuring equipment which is reliable, accurate and precise.

Innovative Aspect and Main Advantages

The correctness and high accuracy of the XRF method depends on the quality of the RM used. RMs supplied by the IAEA and ANBS are produced from natural materials.

However RMs from natural materials and the ways of their production have a number of disadvantages which are eliminated in technology developed in Andronikashvili Institute of Physics. RM-s produces by us are: reproducible, easy to certify, not expensive and time consuming. They have a defined geometrical form and are solid and hence, do not require special packing, are homogenous and are hygroscopic, number of elements is unlimited and is stable over time.

Areas of Application

Standard samples can be used in every field of industry and technology where is used XRF method. It may be used in natural environment can analyse substances in heterogeneous states of aggregation.


Fig. 1 Assortment of standard samples produced at
the Institute of Physics of the Georgian Academy of
Sciences.


Fig. 2 Author certifications and decoration for invention
received for standard samples.

Stage of Development

Method for manufacturing of standard samples was successfully established and widely used in industrial and technological research and development in Soviet Union. Many of Mr-s produced in the AIP where acknowledged standard samples and received respective certification.

For restoration of technological process of manufacturing of standard samples is necessary to update laboratory equipment for producing of prototypes for testing and providing of marketing research to investigate possibilities of promotion and evaluation of demand for standard samples.

Contact Details

Andronikashvili Institute of Physics
6 Tamarashvili St. 0177, Tbilisi, Georgia
Contact person: Guram Karumidze
Tel.: (+ 995 32) 22 3251
Fax: (+995 32) 39 1494
E-mail: This e-mail address is being protected from spambots. You need JavaScript enabled to view it

Add comment


Security code
Refresh