Technologies available for licensing, investment, joint ventures and R&D contracts in Ukraine, Azerbaijan, Georgia, Moldova, Uzbekistan

Frontpage Slideshow (version 2.0.0) - Copyright © 2006-2008 by JoomlaWorks

Google Translate

Patenting Information

Tag Cloud



Free counters!

Home Material Sciences Scanning Non-Force Magnetic Microscope

Scanning Non-Force Magnetic Microscope

Description

At development of new materials the check of their local microscopic properties (magnetic, electric, structural) is necessary. One of devices for study of local parameters of materials is the scanning magnetic microscope (MM). In ILTPE of NASU the experimental samples of scanning non-force MM of three types are developed. Two of them are intended for measurement of the parameters of a local constant magnetic field on a surface of investigated object (IO) (Fig.1), and third one are intended for measurement of the local alternating IO magnetic field (Fig.2). The novelty of the development is protected by the Ukrainian patent. The sensitivity of the MM detectors is in a range of 10-9 - 10-12 Tesla at MM spatial resolution of 1-10 microns for a permanent magnetic field and of 10-50 microns for a alternating field. The indicated MM are intended both for detection and location of magnetic particles(Fig.3) and structural defects on a surface and in depth of magnetic and non-magnetic conductive materials (Fig.4).

The indicated functions can be incorporated in one microscope. The operating principle of the indicated MM allows to enhance the spatial resolution up to sub micron range. In contrast to known analogs the proposed MM:

  • can be used for measurement of the constant and alternating magnetic field;
  • includes measurements of magnetic and non-magnetic objects having complex profile by method of eddy currents;
  • does not require applying of deficient liquid helium for a SQUID - detector, as it operates at Т = 77К

Innovative Aspect and Main Advantages

  • Super high magnetic sensitivity
  • Possibility to operate using the same device both at passive measurement regime of the local permanent magnetic field of the object and active regime by eddy current method for nonmagnetic objects.
  • Absence of the visible force and magnetic effects on the testing object.

Usage of the proposed technology provides more information for materials investigation at the non destructive diagnostic of different units ( in field of aviation, atomic industry, space industry, chemical machinery

Areas of Application

Offered MM can have application for a non-destructive evaluation in an aviation, atomic industry, space industry, chemical machinery.


Fig. 1 External view of magnetic microscope (MM) 1. Measuring channel with SQUID for "cold" objects study; 2.- Measuring channel with fluxgate for "warm" objects study; 3.- Measuring channel with SQUID for "warm" objects study; 4.- Scanner driving device; 5.- SQUID and fluxgate electronic amplifier; 6.- Personal computer

Fig.2. Appearance of the alternating magnetic field microscope, 1- specimen holder, 2- fluxgate detector. 3-precesion moving table, 4- rough moving table


Fig. 3 MM image of the vertical component of a magnetic field over a small magnetic particle (the size is about 400 μm)

Fig.4 Scan image of the magnetic field distribution over a hole of a diameter 23mm in an aluminum-alloy plate of a thickness 25.4 mm; the frequency of the excitation magnetic field is 3 kHz

Stage of Development

Prototype of the microscope available

Contact Details

Institute for Low Temperature Physics and Engineering of NASU
Bondarenko Stanislav Ivanovich
47,Lenin ave., Kharkov 61103, Ukraine
phone: 38-057-3308533
fax: 38-057-3402223
This e-mail address is being protected from spambots. You need JavaScript enabled to view it

Add comment


Security code
Refresh

For additional technologies go to: http://www.stcu.int